2008

1. P. Moeck, Structural Fingerprinting of Nanocrystals in the Transmission Electron Microscope, Proceedings of the 2008 Northwest Section of the American Physical Society 10th Annual Meeting, B3.00002, May 15 - 17, 2008, Lewis & Clark College, Portland, Oregon.
2. S. Rouvimov, N. N. Ledentsov, P. Moeck, V. A. Shchukin, D. Bimberg, HRTEM of Quantum Dot Nanostructures: The First 15 Years, Proceedings of the 2008 Northwest Section of the American Physical Society 10th Annual Meeting, B3.00003, May 15 - 17, 2008, Lewis & Clark College, Portland, Oregon.
3. P. Sondergeld, B. Dušek, H. Hanke, P. Moeck, Purpose and Features of Web-Based Open-Access Crystallographic Databases, Proceedings of the 2008 Northwest Section of the American Physical Society 10th Annual Meeting, G2.00004, May 15 - 17, 2008, Lewis & Clark College, Portland, Oregon.
4. P. Moeck, S. Rouvimov, P. Oleynikov, X. Zou, S. Hovmoeller, Y. Maniette, S. Nicolopoulos, Structural Fingerprinting of Nanocrystals in the Transmission Electron Microscope, NE11, Cascadia Nanotechnology Symposium 2008, March 4 - 5, 2008, Plaza Hotel & Convention Center, Vancouver, Canada, poster.
5. P. Moeck, Structural Fingerprinting in the Transmission Electron Microscope, Proceedings of the 2008 Oregon Academy of Science 66th Annual Meeting, Volume 44, February 23, 2008, Portland Community College, Sylvania Campus, Portland, Oregon.

2007

1. P. Moeck, R. Bjorge, Lattice-Fringe Fingerprinting: Structural Identification of Nanocrystals by HRTEM, Proceedings 2007 Materials Research Society Fall Meeting Volume 1026E C17.10, November 26 - 30, 2007, Boston, Massachussetts.
2. P. Moeck, C. Li, R. Erni, N. D. Browning, A. Gupta, K. V. Rao, Partial Structural Transitions in GaN during CuO Calcination at 500 C, Proceedings 2007 Materials Research Society Fall Meeting Volume 1026E C17.9, November 26 - 30, 2007, Boston, Massachussetts, poster.
3. P. Moeck, Identifying Unknown Nanocrystal Phases by Lattice-Fringe Fingerprinting with Open Access Database Support, Proceedings of the AAAS Pacific Division 88th Annual Meeting Volume 26 Part 1 p. 39, June 17 - 21, 2007, Boise State University, Boise, Idaho.
4. P. Moeck, Open Access Crystallographic Databases for Materials Science Education and Research, Proceedings of the AAAS Pacific Division 88th Annual Meeting Volume 26 Part 1 p. 42, June 17 - 21, 2007, Boise State University, Boise, Idaho.
5. P. Moeck, L. Noice, C. Li, A. Gupta, R. Erni, N. D. Browning, V. K. Rao, Structural Effects of Transition Metal Oxide Calcinations on Wurtzite Type Semiconductors That Are Ferromagnetic at Room Temperature, Proceedings 2007 Materials Research Society Spring Meeting Volume 999E K3.1., April 9 — 13, 2007, San Francisco, California.

2006

1. P. Moeck, J. Zahornadský, B. Dušek, P. Fraundorf, Image-based Nanocrystallography with Online Database Support, Proceedings of SPIE Volume 6370 63701A, DOI:10.1117/12.676656, October 1, 2006, Boston, Massachussetts, poster.
2. R. Bjorge, B. Seipel, P. Moeck, P. Fraundorf, Nanocrystal Phase Identification by Lattice Fringe Fingerprinting from High Resolution Transmission Electron Microscope Images, Proceedings of the 2006 Northwest Section of the American Physical Society 8th Annual Meeting, G3.00003, May 19 - 20, 2006, University of Puget Sound, Tacoma, Washington.
3. P. Moeck, B. Seipel, R. Bjorge, P. Fraundorf, Image-based Nanocrystallography in Two and Three Dimensions with Database Support, Proceedings of the 2006 Northwest Section of the American Physical Society 8th Annual Meeting, G3.00002, May 19 - 20, 2006, University of Puget Sound, Tacoma, Washington.
4. P. Moeck, B. Seipel, G. Upreti, M. Harvey, W. Garrick, Open Access Internet Resources for Nano-Materials Physics Education, Proceedings of the 2006 Northwest Section of the American Physical Society 8th Annual Meeting, G3.00008, May 19 - 20, 2006, University of Puget Sound, Tacoma, Washington.
5. G. Upreti, B. Seipel, M. Harvey, W. Garrick, P. Moeck, Internet Based Open Access Crystallographic Databases, Proceedings of the 2006 Northwest Section of the American Physical Society 8th Annual Meeting, C1.00003, May 19 - 20, 2006, University of Puget Sound, Tacoma, Washington.
6. P. Moeck, B. Seipel, R. Bjorge, P. Fraundorf, Lattice Fringe Fingerprinting in Two Dimensions with Database Support, Technical Proceedings of the 2006 9th Annual NSTI Nanotechnology Conference and Trade Show, Volume 1, 741 - 744, May 7 - 11, 2006, Hynes Convention Center, Boston, Massachussetts, poster.
7. L. Noice, B. Seipel, R. Erni, A. Gupta, C. Li, P. Moeck, V. Rao, N. Browning, Above Room-Temperature Ferromagnetism in GaN Powders by Calcinations with CuO. Proceedings 2006 Materials Research Society Spring Meeting Volume 941E Q8.14, April 17 - 21, 2006, San Francisco, California.
8. P. Moeck, B. Seipel, G. Upreti, M. Harvey, W. Garrick, Freely Accessible Internet Resources for Nanoscience and Nanotechnology Education and Research at Portland State University's Research Servers, Proceedings 2006 Materials Research Society Spring Meeting Volume 931E Q8.14, April 17 - 21, 2006, San Francisco, California.
9. R. Bjorge, B. Seipel, P. Moeck, E. Mandell, P. Fraundorf, Fringe Fingerprints of Nanocrystals from High-Resolution Transmission Electron Microscopy, Proceedings of the 2006 Oregon Academy of Science 64th Annual Meeting, Volume 42, February 25, 2006, University of Oregon, Eugene, Oregon.
10. L. Noice, B. Seipel, A. Gupta, P. Moeck, K. V. Rao, Powder X-ray Diffraction Characterization of Zinc Oxide Powders Calcined with Transition Metal Oxides, Proceedings of the 2006 Oregon Academy of Science 64th Annual Meeting, Volume 42, February 25, 2006, University of Oregon, Eugene, Oregon.
11. G. Upreti, O. Čertík, B. Seipel, M. Harvey, W. Garrick, P. Moeck, Free Crystallographic On-Line Databases and Three-Dimensional Crystal Structure Visualization, Proceedings of the 2006 Oregon Academy of Science 64th Annual Meeting, Volume 42, February 25, 2006, University of Oregon, Eugene, Oregon.

2005

1. P. Moeck, Crystal Structure Visualizations in Three Dimensions with Database Support, Proceedings 2005 Materials Research Society Fall Meeting Volume 909E PP3.5, November 28 - December 2, 2005, Boston, Massachussetts.
2. L. Noice, B. Seipel, G. Grathoff, A. Gupta, P. Moeck, V. K. Rao, Structural Studies of ZnO Calcined with Transition Metal Oxides, Proceedings 2005 Materials Research Society Fall Meeting Volume 891 EE10.10, November 28 - December 2, 2005, Boston, Massachussetts.
3. P. Moeck, Nanometrology Device Standards for Scanning Probe Microscopes and Processes for Their Fabrication and Usage, Proceedings of SPIE Volume 6000 60000Q, DOI:10.1117/12.629785, October 24, 2005, Boston, Massachussetts, poster.
4. P. Moeck, O. Čertík, B. Seipel, R. Groebner, L. Noice, G. Upreti, P. Fraundorf, R. Erni, N. D. Browning, A. Kiesow, J.-P. Jolivet, Identifying Unknown Nanocrystals by Fringe Fingerprinting in Two Dimensions and Free-Access Crystallographic Databases, Proceedings of SPIE Volume 6000 60000M-1, DOI:10.1117/12.629818, October 24, 2005, Boston, Massachussetts.
5. P. Moeck, Epitaxial and Endotaxial Semiconductor Quantum Dots: Atomic Order, Morphological Transformations, and Structural Transitions, Proceedings of SPIE Volume 6002 600020F, DOI:10.1117/12.634870, October 23, 2005, Boston, Massachussetts.
6. P. Moeck, B. Seipel, W. Qin, P. Fraundorf, Image-based Nanocrystallography: Fringe Fingerprinting in Two and Three Dimensions and Methodology to Derive the Morphology of Nanocrystals, 5th Annual Nanoscale Science and Technology Workshop 2005, September 20 - 21, 2005, Center for Nanotechnology at the University of Washington, Seattle, Washington.
7. B. Seipel, A. Gupta, C. Li, P. Moeck, R. Erni, N. D. Browning, F. Owen, K.V. Rao, Structural and Spectroscopic Investigations on Transition Metal Incorporation in Wide-Band-Gap Semiconductors, 5th Annual Nanoscale Science and Technology Workshop 2005, September 20 - 21, 2005, Center for Nanotechnology at the University of Washington, Seattle, Washington.
8. B. Seipel, L. Noice, C. Li, A. Gupta, P. Moeck, K. V. Rao, R. Erni, N. D. Browning, F. Owens, Structural and Spectroscopic Studies of ZnO and GaN Powders Calcined with Transition Metal Oxides, 5th Annual Nanoscale Science and Technology Workshop 2005, September 20 - 21, 2005, Center for Nanotechnology at the University of Washington, Seattle, Washington, poster.
9. P. Moeck, B. Seipel, W. Qin, E. Mandell and P. Fraundorf, Image Based 3D Nanocrystallography by Means of Tilt Protocol / Lattice Fringe Fingerprinting with Contemporary Side-Entry Specimen Goniometers, Proceedings Microscopy and Microanalysis Volume 11 Supplement 2 (2005) pp. 632 - 633, July 31 - August 4, 2005, Honolulu, Hawaii.
10. B. Seipel, P. Moeck, W. Qin, E. Mandell, P. Fraundorf, Image-Based Nanocrystallography by Means of Tilt Protocol / Lattice Fringe Fingerprinting: Proof of Principle on TiO2 Nanoparticles, Proceedings Microscopy and Microanalysis Volume 11 Supplement 2 (2005) pp. 567 - 577, July 31 - August 4, 2005, Honolulu, Hawaii.
11. P. Moeck, Image-Based Nanocrystallography: Overview and Novel Method to Derive the Structure and Properties of an Ensemble of Nanocrystals, Proceedings of the 2005 Micro Nano Breakthrough Conference, July 25 - 28, 2005, University Place Conference Center, Portland, Oregon, poster.
12. P. Moeck, Nanometrology Device Standards for Scanning Probe Microscopes and Processes for Their Fabrication and Usage, Proceedings of the 2005 Micro Nano Breakthrough Conference, July 25 - 28, 2005, University Place Conference Center, Portland, Oregon, poster.
13. P. Moeck, A. Gupta, B. Seipel, C. Li, G. Upreti, K. V. Rao, R. Erni, N. D. Browning, J. Guao, Ferromagnetic Oxides and Nitrides for Spintronic Applications, Proceedings of the 2005 Micro Nano Breakthrough Conference, July 25 - 28, 2005, University Place Conference Center, Portland, Oregon, poster.
14. B. Seipel, G. Upreti, R. Groebner, P. Moeck, W. Qin, E. Mandell, P. Fraundorf, Image-Based Nanocrystallography by Means of Lattice Fringe- Fingerprinting and Transmission Electron Goniometry: Proof of Principle on Titania and Gold Nanoparticles, Proceedings of the 2005 Micro Nano Breakthrough Conference, July 25 - 28, 2005, University Place Conference Center, Portland, Oregon, poster.
15. P. Moeck, B. Seipel, W. Qin, E. Mandell, P. Fraundorf, Image Based Nanocrystallography: Its Relation to Electron Tomography for Materials Science Applications & Characterization of Titania Nanoparticles by Means of Transmission Electron Goniometry, 9th World Multiconference on Systemics, Cybernetics and Informatics (WMSCI 2005), July 1 - 13, 2005, Orlando, Florida.
16. P. Moeck, B. Seipel, W. Qin, E., Mandell, P. Fraundorf, Image-based Nanocrystallography, Discrete Atomic Resolution Electron Tomography and Tilt Protocol / Lattice-fringe Fingerprinting, Proceedings of the AAAS Pacific Division 86th Annual Meeting Volume 24 Part 1 p. 72, June 12 - 16, 2005, Southern Oregon University, Ashland, Oregon.
17. L. Noice, J. Hibbard, G. Upreti, B. Seipel, P. Moeck, A. Gupta, K. V. Rao, X-Ray Powder Diffraction to Demonstrate Doping of Zinc Oxide with Manganese and Copper, Proceedings of the AAAS Pacific Division 86th Annual Meeting Volume 24 Part 1 p. 75, June 12 - 16, 2005, Southern Oregon University, Ashland, Oregon, poster.
18. B. Seipel, A. Gupta, C. Li, G. Upreti, P. Moeck, Ferromagnetic Semiconductors for Prospective Spintronics Applications, Proceedings of the AAAS Pacific Division 86th Annual Meeting, Ashland, Oregon, Volume 24 Part 1 p. 84, June 12 - 16, 2005, Southern Oregon University, Ashland, Oregon.
19. P. Moeck, B. Seipel, Image-Based Nanocrystallography and its Relation to Electron Tomography for Materials Science Applications, Proceedings of the 2005 Oregon Academy of Science 63rd Annual Meeting, Volume 41, February 26, 2005, Oregon State University, Corvallis, Oregon.
20. K. Padmanabhan, P. Moeck, Computer Simulations to Support Student's Comprehension of Crystallographic Core Concepts, Proceedings of the 2005 Oregon Academy of Science 63rd Annual Meeting, Volume 41, February 26, 2005, Oregon State University, Corvallis, Oregon.
21. B. Seipel, A. Gupta, G. Upreti, C. Li, P. Moeck, K. V. Rao, R. Erni, N. D. Browning, Ferromagnetic Semiconductors for Spintronic Applications, Proceedings of the 2005 Oregon Academy of Science 63rd Annual Meeting, Volume 41, February 26, 2005, Oregon State University, Corvallis, Oregon.

2004

1. P. Moeck, M. Kapilashrami, A. Rao, K. Aldushin, J. Lee, J. E. Morris, N. D. Browning, P. J. McCann, Nominal PbSe Nano-Islands on PbTe: Grown by MBE, Analyzed by AFM and TEM, Proceedings 2004 Materials Research Society Fall Meeting Volume 829 B9.4, November 29 - December 3, 2004, Boston, Massachussetts.
2. P. Moeck, B. Seipel, W. Qin, P. Fraundorf, Image-based Nanocrystallography by Means of Transmission Electron Goniometry, 4th Annual Nanoscale Science and Technology Workshop, September 16 - 17, 2004, Center for Nanotechnology at the University of Washington, Seattle, Washington.
3. P. Moeck, M. Kapilashrami, A. Rao, N. D. Browning, P. J. McCann, Nominal PbSe Nano-Islands on PbTe: Grown by MBE, Analyzed by AFM and TEM, 4th Annual Nanoscale Science and Technology Workshop, September 16 - 17, 2004, Center for Nanotechnology at the University of Washington, Seattle, Washington, poster.
4. P. Moeck, B. Seipel, W. Qin, and P. Fraundorf, Image-Based Nanocrystallography by Means of Transmission Electron Goniometry, Proceedings 2004 Meeting of the Focused Interest Group on Materials Research in an Aberration-Free Environment, Microscopy and Microanalysis Volume 10 Supplement 3 (2004) pp. 50 - 51, July 31 - August 1, 2004, Savanna, Georgia.
5. P. Moeck, B. Seipel, K. Padmanabhan, M. Kapilashrami, W. Qin, P. Fraundorf, Image-Based Nanocrystallography by Means of Transmission Electron Goniometry, Proceedings of the 2004 Micro Nano Breakthrough Conference, July 28 - 29, 2004, Sheraton Portland Airport, Portland, Oregon, poster.
6. P. Moeck, K. Pierz, Crystallographic Structure and Photoluminescence of Atomically Ordered (Cd,Mn,Zn)Se Quantum Dots in (Mn,Zn)Se Matrix, Proceedings of the 2004 Micro Nano Breakthrough Conference, July 28 - 29, 2004, Sheraton Portland Airport, Portland, Oregon, poster.
7. P. Moeck, M. Kapilashrami, J. Lee, J. Morris, N. D. Browning, P. McCann, Nominal PbSe Nano-Islands on PbTe: Grown by MBE, Analyzed by AFM and TEM, Proceedings of the 2004 Micro Nano Breakthrough Conference, July 28 - 29, 2004, Sheraton Portland Airport, Portland, Oregon, poster.
8. P. Moeck, N. D. Browning, Structural Transitions in Epitaxial and Endotaxial Self-Assembled Semiconductor Quantum Dots, Proceedings of the 2004 Micro Nano Breakthrough Conference, July 28 - 29, 2004, Sheraton Portland Airport, Portland, Oregon, poster.
9. P. Moeck, K. Padmanabhan, W. Qin, P. Fraundorf, Goniometry of Direct Lattice Vectors Supporting Students' Comprehension of Crystallograhic Core Concepts and Demonstrating Image-Based Nanocrystallography, Proceedings 2004 Materials Research Society Spring Meeting Volume 827E BB2.9, April 12 - 16, 2004, San Francisco, California.
10. P. Moeck, W. Qin, P. Fraundorf, Image-Based Nanocrystallography in Future Aberration-Corrected Transmission Electron Microscopes, Proceedings 2004 Materials Research Society Spring Meeting Volume 818 M11.3, April 12 - 16, 2004, San Francisco, California.
11. P. Moeck, K. Padmanabhan, W. Qin, P. Fraundorf, Nanocrystallography by Means of Transmission Electron Microscopy / Goniometry, Proceedings of the 2004 Oregon Academy of Science 62nd Annual Meeting, Volume 40, February 22, 2004, Portland State University, Portland, Oregon.
12. K. Padmanabhan, P. Moeck, Computer Simulations to Support Student's Comprehension of Crystallographic Core Concepts, Proceedings of the 2004 Oregon Academy of Science 62nd Annual Meeting, Volume 40, February 22, 2004, Portland State University, Portland, Oregon, poster.

2003

1. P. Moeck, Nanometer Sized Pb(Se,Te) Islands and Their Crystallographic Structures, Proceedings 2003 Materials Research Society Fall Meeting Volume 794 T10.7, December 1 - 5, 2003, Boston, Massachussetts.
2. P. Moeck, Endotaxial Growth and Structural Transitions of α-Sn Quantum Dots in Si Matrix, 3rd Annual Nanoscale Science and Technology Workshop, September 22 - 23, 2003, Center for Nanotechnology at the University of Washington, Seattle, Washington, poster.
3. P. Moeck, Structural Transitions in Epitaxial and Endotaxial Self-Assembled Semiconductor Quantum Dots: A Brief Overview, 3rd Annual Nanoscale Science and Technology Workshop, September 22 - 23, 2003, Center for Nanotechnology at the University of Washington, Seattle, Washington.
4. P. Moeck, K. Pierz, Crystallographic Structure and Photoluminescence of Atomically Ordered (Cd,Mn,Zn)Se Quantum Dots in (Mn,Zn)Se Matrix, 3rd Annual Nanoscale Science and Technology Workshop, September 22 - 23, 2003, Center for Nanotechnology at the University of Washington, Seattle, Washington, poster.
5. P. Moeck, K. Pierz, Structure and Photoluminescence of Atomically Ordered Epitaxial (Cd,Mn,Zn)Se Quantum Dots, Proceedings of the 2003 Northwest Section of the American Physical Society 5th Annual Meeting, D1.004, May 30 - 31, 2003, Reed College, Portland, Oregon, poster.
6. P. Moeck, Structural Transitions in Epitaxial and Endotaxial Self-Assembled Semiconductor Quantum Dots, Proceedings of the 2003 Northwest Section of the American Physical Society 5th Annual Meeting, J1.003, May 30 - 31, 2003, Reed College, Portland, Oregon.
7. P. Moeck, Atomic Ordering in Self-Assembled Epitaxial and Endotaxial Compound and Element Semiconductor Quantum Dot Structures: The First Review, Proceedings 2003 Materials Research Society Spring Meeting Volume 776 Q5.4, April 21 - 25, 2003, San Francisco, California, poster.
8. P. Moeck, Y. Lei, T. Topuria, N. D. Browning, R. Ragan, K. S. Min, H. A. Atwater, Endotaxial Growth Mechanisms of Sn Quantum Dots in Si Matrix, Proceedings 2003 Materials Research Society Spring Meeting Volume 770 (2003) I1.7, April 21 - 25, 2003, San Francisco, California.
9. P. Moeck, Y. Lei, T. Topuria, N. D. Browning, R. Ragan, K. S. Min, H. A. Atwater, Structural and Morphological Transformations in Self-Assembled Sn Quantum Dots in Si Matrix, Proceedings of the 2003 6th Annual NSTI Nanotechnology Conference and Trade Show, Volume 3, 74 - 78, February 23 - 27, 2003, San Francisco, California, poster.
10. P. Moeck, Structural Transformations in Epitaxial and Endotaxial Self-Assembled Semiconductor Quantum Dots: A Review, Proceedings of the 2003 Oregon Academy of Science 61st Annual Meeting, Volume 39, February 22, 2003, Linfield College, McMinnville Campus, McMinnville, Oregon.

2002

1. P. Moeck, K. Pierz, T. Topuria, N. D. Browning, H. Wu, and P. J. McCann, Atomic Ordering in Self-assembled Epitaxial II-VI and IV-VI Compound Semiconductor Quantum Dot Systems, Proceedings of the Materials Research Society Symposium Volume 749 Proceedings 2002 Materials Research Society Fall Meeting Volume 749 W13.5, December 2 - 6, 2002, Boston, Massachussetts.
2. Y. Lei, Peter Moeck, T. Topuria, N. D. Browning, Direct Observation of Void-Mediated Formation of Sn Quantum Dots, Proceedings 2002 Materials Research Society Fall Meeting Volume 737 E13.36, December 2 - 6, 2002, Boston, Massachussetts, poster.
3. P. Moeck, Y. Lei, T. Topuria, N. D. Browning, R. Ragan, K. S. Min, H. A. Atwater, Formation Mechanism of Quantum Dots in the Sn/Si System, Proceedings of the 2nd International Workshop on Quantum Nanostructures & Nanoelectronics, pp. 241 – 246, AIST-Tsukuba Research Center, September 9 - 11, 2002, Tsukuba, Japan.
4. Y. Lei, P. Moeck, T. Topuria, N. D. Browning, R. Ragan, H. A. Atwater, Atomic Scale Structural Analysis of Sn-Si Quantum Dots, Proceedings of the 15th International Congress on Electron Microscopy, September 1 – 6, 2002, Durban, South Africa.
5. Y. Lei, P. Moeck, T. Topuria, N. D. Browning, R. Ragan, H. A. Atwater, Atomic Scale Structural Analysis of Sn-Si Quantum Dots, Proceedings Microscopy and Microanalysis 2002, August 4 – 8, 2002, Quebec City, Canada.
6. P. Moeck, Y. Lei, T. Topuria, N. D. Browning, R. Ragan, K. S. Min, and H. A. Atwater, Structural Transformations in Self-Assembled Semiconductor Quantum Dots as Inferred by Transmission Electron Microscopy, Proceedings of the 47th Annual Meeting of The International Society for Optical Engineering (SPIE), Symposium 4807 “Physical Chemistry of Interfaces and Nanomaterials”, July 7 - 11, 2002, Seattle, Washington.
7. P. Moeck, Y. Lei, T. Topuria, N. D. Browning, A Structural Instability in Stranski-Krastanow Grown Quantum Dots, Proceedings of the March 2002 American Physical Society 4th Annual Meeting, Q17.013, March 18 - 22, 2002, Indiana Convention Center, Indianapolis, Indiana.

2001

1. P. Moeck, T. Topuria, N. D. Browning, R. J. Nicholas, R. G. Booker, Atomic Self-Ordering in Heteroepitaxially Grown Semiconductor Quantum Dots Due to Relaxation of External Lattice Mismatch Strains, Proceedings 2001 Materials Research Society Fall Meeting Volume 696 N8.8, November 26 - 30, 2001, Boston, Massachussetts.
2. P. Moeck, T. Topuria, Y. Y. Lei, N. D. Browning, Classification of Structural Order in Self-Assembled Semiconductor Quantum Dots, Proceedings Frontiers of Nanostructured Systems, Omni Hotel, October 14 – 16, 2001, Charlottesville, Virginia, poster.
3. P. Moeck, T. Topuria, N. D. Browning, M. Dobrowolska, S. Lee, J. K. Furdyna, G. R. Booker, N. J. Mason, R. J. Nicholas, Self-Ordered Structures and Compositional Modulations on the Atomic scale in (Cd,Zn,Mn)Se and In(Sb,As) Quantum Dot Structures, Proceedings 2001 Electronic Materials Conference (43rd conference), University of Notre Dame, June 27 – 29, 2001, Notre Dame, Indiana.
4. N. D. Browning, I. Arslan, E.M. James, P. Moeck, T. Topuria, Y. Xinn, Analyzing Interfaces and Defects in Semiconducting Materials on the Atomic Scale, Proceedings of the Royal Microscopical Society Conference, University of Oxford, March 25 - 29, 2001, Oxford, U.K..
5. P. Moeck, T. Topuria, N. D. Browning, G. R. Booker, N. J. Mason, R. J. Nicholas, L. V. Titova, M. Dobrowolska, S. Lee, J. K. Furdyna, Self-Ordering on a Multiple Length Scale in Certain Heteroepitaxial II-VI and III-V Compound Semiconductors Structures, Proceedings of the 6th International Symposium on Advanced Physical Fields Growth of Well-defined Nanostructures, March 6 - 9, 2001, National Institute of Metals, Tsukuba, Japan, p. 251 – 255, poster.

2000

1. P. Moeck, T. Topuria, N. D. Browning, G. R. Booker, N. J. Mason, R. J. Nicholas, L. V. Titova, M. Dobrowolska, S. Lee, J. K. Furdyna, Self-Ordering in CdSe/ZnSe, CdSe/(Zn,Mn)Se, InSb/GaSb, and InSb/InAs Quantum Dot Structures and a Novel Type of Quantum Dot, Proceedings 2000 Materials Research Society Fall Meeting Vol 642 J6.3, November 27 – December 1, 2000, Boston, Massachusetts.
2. T. Topuria, P. Moeck, N. D. Browning, M. Dobrowolska, L. Titova, S. Lee, J. K. Furdyna, Z-Contrast Scanning Transmission Electron Microscopy on Self-Assembled CdSe Quantum Dots in ZnSe and (Zn,Mn)Se Matrices, Proceedings 2000 Materials Research Society Fall Meeting Volume 642 J8.3, November 27 – December 1, 2000, Boston, Massachusetts.
3. T. Topuria, P. Moeck, N. D. Browning, L. Titova, M. Dobrowolska, S. Lee and J. K. Furdyna, Self-Ordered CdSe Quantum Dots in ZnSe and (Zn,Mn)Se Matrices Assessed by Transmission Electron Microscopy and Photoluminescence Spectroscopy, Proceedings 2000 U.S. Workshop on the Physics and Chemistry of II-VI Materials, October 30 – November 1, 2000, Albuquerque, New Mexico.
4. P. Moeck, Thermal Treatment Induced Dislocation Bundles in GaAs Substrates Studied by Scanning Infrared Polariscopy, Visible-Light Interferometry, Transmission Electron Microscopy, Makyoh and X-ray Topography, Proceedings Microscopy and Microanalysis 2000, edited by G. W. Bailey S. McKernan, R. L. Price, S. D. Walck, P.-M. Charest, R. Gauvin, pp. 1104 - 1105, August 13 – 17, 2000, Philadelphia, Pennsylvania, poster.
5. P. Moeck, G. R. Booker, E. Alphandéry, N. J. Mason, R. J. Nicholas, Self-Organised Sb-Based Quantum Dot Structures Studied by Means of AFM, TEM and PL, Proceedings Microscopy and Microanalysis 2000, edited by G. W. Bailey S. McKernan, R. L. Price, S. D. Walck, P.-M. Charest, R. Gauvin, pp. 1102 – 1103, August 13 - 17, 2000, Philadelphia, Pennsylvania, poster.
6. P. Moeck, G. R. Booker, E. Alphandéry, N. J. Mason, R. J. Nicholas, T. Topuria, N. D. Browning, MOVPE Grown Self-Assembled and Self-Ordered (In,Ga)Sb Quantum Dots in GaSb Matrix Assessed by Means of AFM, TEM and PL, Proceedings of the 5th International Workshop on Expert Evaluation and Control of Compound Semiconductor Materials and Technologies, May 21 – 24, 2000, Heraclion, Greece.

1999

1. P. Moeck, G. R. Booker, Comparison between Experiment and Theory for MBE Sample-Holder Induced Plastic Deformation, Proceedings of the 3rd International Conference on Mid-Infrared Optoelectronic Materials and Devices, September 5 - 7, 1999, Aachen Germany, poster.
2. P. Moeck, G. R. Booker, E. Alphandéry, R. J. Nicholas, N. J. Mason, MOVPE Grown Self-Assembled Sb-Based Quantum Dots Assessed by Means of AFM, TEM and PL, Proceedings of the 3rd International Mid-Infrared Optoelectronics - Materials and Devices Conference, September 5 - 7, 1999, Aachen Germany, p. O14.
3. P. Moeck, G. R. Booker, E. Alphandéry, R. J. Nicholas, N. J. Mason, Self-Assembled InSb Quantum Dots in InAs and GaSb Matrices Assessed by Means of TEM, AFM and PL, Proceedings of the XI International Conference on Microscopy of Semiconducting Materials, March 22 - 25, 1999, Oxford, poster.
4. P. Moeck, M. Fukuzawa, Z. Laczik, M. Yamada, G. W. Smith, G. R. Booker, B. K. Tanner, M. Herms, Dislocation Bundles in GaAs Substrates: an X-ray Topography & Diffraction, Scanning Infrared Polariscopy, Electron Microscopy, Nomarski Microscopy, and Makyoh Topography Assessment, Proceedings of the XI International Conference on Microscopy of Semiconducting Materials, March 22 - 25, 1999, Oxford, U.K..
5. H. R. Hardaway, J. Heber, P. Moeck, M. J. Pullin, T. Stradling, P. J. Tang, C. C. Phillips, Optical Studies of InAs/In(As,Sb) Single Quantum Well (SQW) and Strained-Layer Superlattice (SLS) LEDs for the Mid-Infrared (MIR) Region, Proceedings of SPIE Volume 3621 124, DOI:10.1117/12.344470, San Jose, CA, January 27 - 28, 1999, San Jose, California.

1998

1. E. Alphandéry, R. J. Nicholas, N. J. Mason, P. Moeck, G. R. Booker, Photoluminescence and Magnetoluminescence of Self-Assembled InSb Quantum Dots on GaSb, Proceedings of the 24th International Conference on the Physics of Semiconductors, Jerusalem, Israel, August 2 - 7, 1998, Jerusalem, Israel.
2. K. Mizuno, P. Moeck, B. K. Tanner, G. Lacey, C. R. Whitehouse, G. W. Smith, A. M. Keir, Strain Relaxation in an (In,Ga)As Epilayer by Means of Twin Formation, Proceedings of the 12th International Conference on Crystal Growth in Conjunction with the 10th International Conference on Vapour Growth and Epitaxy, July 26 - 31, 1998, Jerusalem, Israel, p. 335, poster.
3. P. Moeck, K. Mizuno, B. K. Tanner, G. W. Smith, Assessment of Oval Defects by Means of Double-Crystal Synchrotron X-ray Reflection Topography, Proceedings of the 12th International Conference on Crystal Growth in Conjunction with the 10th International Conference on Vapour Growth and Epitaxy, July 26 - 31, 1998, Jerusalem, Israel, p. 101, poster.
4. P. Moeck, B. K. Tanner, G. Lacey, C. R. Whitehouse, G. W. Smith, Critical Thickness Observation Window of Quantum-Well Structures as Observed by Synchrotron X-ray Topography, Proceedings of the 12th International Conference on Crystal Growth in Conjunction with the 10th International Conference on Vapour Growth and Epitaxy, July 26 - 31, 1998, Jerusalem, Israel, p. 174, poster.
5. P. Moeck, B. K. Tanner, G. W. Smith, Dislocations in GaAs Substrates Originating at Sample Holders During Molecular Beam Epitaxy, Proceedings of the 12th International Conference on Crystal Growth in Conjunction with the 10th International Conference on Vapour Growth and Epitaxy, July 26 - 31, 1998, Jerusalem, Israel, p. 323, poster.
6. B. K. Tanner, A. M. Keir, P. Moeck, C. R. Whitehouse, G. Lacey, A. D. Johnson, G. W. Smith, G. F. Clark, X-ray Optics of In-Situ Synchrotron Topography Studies of the Early Stages of Relaxation in Epitaxial InGaAs on GaAs, Proceedings of SPIE Volume 3448 100, DOI:10.1117/12.332496, July 21 – 22, 1998, San Diego, California.
7. M. J. Pullin, H. R. Hardaway, J. Heber, P. Moeck, C. C. Phillips, W. T. Yuen, 300K Operation and Negative Luminescence from In(As,Sb) SLS LEDs with AlSb Barriers for Improved Carrier Confinement, Proceedings of the 2nd International Conference on Mid-Infrared Optoelectronics Materials and Devices, March 26 – 27, 1998, Prague, Czech Republic.
8. P. Moeck, B. K. Tanner, G. Lacey, C. R. Whitehouse, Critical Thickness of Single Strained (Ga,In)As Layers as Observed by In-Situ Synchrotron X-ray Topography, Proceedings of the 6th Annual Conference of the German Crystallographic Society, March 2 - 5, 1998, Karlsruhe, Germany.
9. P. Moeck, B. K. Tanner, G. Lacey, C. R. Whitehouse, G. W. Smith, Critical Thickness Observation Window of Quantum-Well Structures as Observed by Synchrotron X-ray Topography, Proceedings of the 6th Annual Conference of the German Crystallographic Society, March 2 - 5, 1998, Karlsruhe, Germany.
10. P. Moeck, B. K. Tanner, K. Mizuno, G. W. Smith, Assessment of Oval Defects by Means of Double-Crystal Synchrotron X-ray Reflection Topography, Proceedings of the 6th Annual Conference of the German Crystallographic Society, March 2 - 5, 1998, Karlsruhe, Germany.
11. C. C. Phillips, H. R. Hardaway, J. Heber, P. Moeck, M. J. Pullin, P. J. Tang, P. Yuen, Recent Advances in In(As,Sb) SLS and QW LEDs for the 3- to 10-um Region, Proceedings of SPIE Volume 3279 154, DOI:10.1117/12.304425, January 28 - 29, 1998, San Jose, California.

1997

1. K. Mizuno, P. Moeck, B. K. Tanner, G. Lacey, C. R. Whitehorse, G. W. Smith, A. M. Keir, Strain Relaxation of an InGaAs Epilayer on GaAs, Proceedings of the Sectional Meeting of the Physical Society of Japan, Vol. 52, Issue 2, Part 2, p. 107, October 5 - 8, 1997, Kobe University, Japan.
2. P. Moeck, B. K. Tanner, G. Lacey, C. R. Whitehouse, G. W. Smith, Critical Thickness of Quantum Well Structures: Limits of the Misfit Dislocation Removal Effect as Corroborated by Synchrotron X-ray Reflection Topography, Proceedings of the SR User Meeting, September 9 - 10, 1997, Daresbury, England, poster.
3. P. Moeck, B. K. Tanner, G. W. Smith, Assessment of Oval Defects by Means of Double-Crystal Synchrotron X-ray Reflection Topography, Proceedings of the SR User Meeting, September 9 - 10, 1997, Daresbury, England, poster.
4. B. K. Tanner, P. Moeck, K. Mizuno, Identification of Misfit Dislocations Using X-ray Scattering and Topography, Proceedings of the 7th International Conference on Defect Recognition and Image Processing in Semiconductors, i.e. Solid State Phenomena series, Volume 160, Chapter 104, pp. 177 - 186, September 7 – 10, 1997, Templin, Germany.
5. B. K. Tanner, P. Moeck, K. Mizuno, G. Lacey, C. R. Whitehouse, G. W. Smith, A. D. Johnson, The Early Stages of Relaxation in Epitaxial InGaAs on GaAs, Proceedings of the X-TOP Symposium, Denver X-ray Conference, August 4 – 8, 1997, Denver, Colorado.
6. P. Moeck, G. Lacey, B. K. Tanner, C. R. Whitehouse, G. W. Smith, Critical Thickness of Quantum Well Structures: Modified Matthews-Blakeslee Type Formula and Experimental Verification Employing Synchrotron X-ray Reflection Topography and Diffractometry, Proceedings of the Xth International Conference on Microscopy of Semiconducting Materials, April 7 - 10, 1997, Oxford, England, P1 - 31, poster.
7. P. Moeck, B. K. Tanner, K. Mizuno, G. W. Smith, A. M. Keir, G. Lacey, C. R. Whitehouse, Relaxation of Capped (In,Ga)As on GaAs by Means of a Twin Formation Mechanism, Proceedings of the Xth International Conference on Microscopy of Semiconducting Materials, April 7 - 10, 1997, Oxford, England, P1 - 32, poster.

1996

1. P. Moeck, B. K. Tanner, C. R. Whitehouse, A. G. Cullis, G. Lacey, G. F. Clark, B. Lunn, J. C. H. Hogg, A. M. Keir, A. D. Johnson, G. W. Smith, T. Martin, Relaxation of Low Misfit (In,Ga)As on GaAs from In-Situ Synchrotron Double-Crystal X-ray Topography and Diffractometry, Proceedings of the 23rd International Conference on the Physics of Semiconductors, July 21 - 26, 1996, Berlin, Germany, p. Th2C-3.

1995

1. P. Moeck, B. K. Tanner, A. G. Cullis, S. J. Barnett, A. M. Keir, A. D. Johnson, T. Martin, J. Jefferson, G. W. Smith, M. Emeny, C. R. Whitehouse, G. Lacey, G. F. Clark, B. Lunn, J. C. H. Hogg, P. Ashu, W. E. Hagston, Relaxation of Low Misfit (In,Ga)As on GaAs from In-Situ Synchrotron High Resolution X-ray Diffraction, Proceedings Meeting Strained Layer Structures and Devices of the Semiconductor Physics Group of the Institute of Physics, September 7, 1995, London, UK, p. 8.
2. C. R. Whitehouse, A. G. Cullis, G. F. Clark, G. Lacey, A. M. Keir, A. D. Johnson, B. Lunn, C. J. Hogg, G. W. Smith, T. Martin P. Moeck, J. H. Jefferson, P. Ashu, B. K. Tanner, W. E. Hagston, In-Situ Synchrotron X-ray Topography Studies of III-V Strained Layer Relaxation Processes, Proceedings Meeting Strained Layer Structures and Devices of the Semiconductor Physics Group of the Institute of Physics, September 7, 1995, London, UK, p. 7.
3. C. R. Whitehouse, A. G. Cullis, S. J. Barnett, G. F. Clark, G. Lacey, A. M. Keir, A. D. Johnson, B. Lunn, C. J. Hogg, G. W. Smith, T. Martin, J. Jefferson, P. Ashu, B. K. Tanner, W. E. Hagston, P. Moeck, In Situ Synchrotron X-Ray Studies of (100) InGaAs/GaAs Strained-Layer Growth Processes, Proceedings of the 9th International Conference on Microscopy of Semiconducting Materials, March 20 - 23, 1995, Oxford, UK.

1994

1. P. Moeck, H. Berger, Determination of Lattice Distortions in Epitaxial Layer Systems, Proceedings of the 2nd European Symposium on X-Ray Topography and High Resolution Diffraction, September 5 - 7, 1994, Berlin, p. 153, poster.

1993

1. P. Moeck, Estimation of Crystal Textures Using Electron Microscopy, Proceedings Dreiländertagung Elektronenmikroskopie, September 5 - 11, 1993, Zürich, Switzerland, p. 58, poster.
2. P. Moeck, Description of the Real Orientation Relationships of Epitaxial Samples Using Transformation Matrices, Proceedings of the 8th International Conference on Microscopy of Semiconducting Materials, April, 3 - 8, 1993, Oxford, UK, poster.
3. K. Bickmann, H. Berger, P. Moeck, J. Hauck, Temperaturabhängigkeit von Orientierungseffekten am Epitaxiesystem CdTe auf GaAs, Proceedings 2. Jahrestagung der Deutschen Gesellschaft für Kristallographie, March 10 - 12, 1993, Bochum, Germany.
4. P. Moeck, Abhängigkeit der Liquidustemperatur von der chemischen Zusammensetzung bei HgaCdbTec-Schmelzlösungen, Proceedings 2. Jahrestagung der Deutschen Gesellschaft für Kristallographie, March 10 - 12, 1993, Bochum, Germany.

1992

1. K. Bickmann, J. Hauck, H. Berger, P. Moeck, Temperaturabhängigkeit der Struktur einer epitaktischen CdTe (111) Schicht auf GaAs (001), Proceedings Röto'92, September 17 - 18, 1992, Jena, Germany.
2. P. Moeck, W. Hoppe, ELCRYSAN - A Program for Direct Crystallographic Analyses, Proceedings of the X. European Congress on Electron Microscopy (EUREM 92), September 7 - 11, 1992, Granada, Spain, p. 193 – 194, poster.
3. P. Moeck, H. Berger, Complete Characterization of Epitaxial Systems from the Lattice Geometrical Point of View, Proceedings of the 10th International Conference on Crystal Growth, August 16 - 21, 1992, San Diego, California, USA, poster.
4. P. Moeck, Description of the Orientation Relationships of Epitaxial Systems by Transformation Matrices, Proceedings of the 14th European Crystallographic Meeting, August, 2 - 7, 1992, Enschede, Netherlands, poster.
5. P. Moeck, W. Hoppe, Vereinfachung von kristallgeometrischen Analysen durch Beugungsgoniometrie und Benutzung des Matrizenkalküls, Proceedings 1. Jahrestagung der Deutschen Gesellschaft für Kristallographie, June 9 - 12, 1992, Mainz, Germany, poster.
6. P. Moeck, H. Berger, Complete Characterization of Epitaxial CdTe on GaAs from the Lattice Geometrical Point of View, Proceedings of the European Materials Research Society Spring Meeting, International Conference on Electronic Materials (ICEM'92), June 2 - 5, 1992, Strasbourg, France, poster.

1991

1. P. Moeck, H. Berger, Complete Characterization of Epitaxial Systems from the Lattice Geometrical Point of View, Proceedings of the 3rd International Symposium on Trends and New Applications in Thin Films, November 26 - 29, 1991, Strasbourg, France, p. 23.
2. P. Moeck, W. Hoppe, Direct Crystallographic Analyses Using Electron Microscopy, Proceedings of the 3rd International Symposium on Trends and New Applications in Thin Films, November 26 - 29, 1991, Strasbourg, France, p. 110, poster.
3. H. Berger, P. Moeck, B. Rosner, On the Description and Interpretation of Systematic Deviations from Simple Orientations in Epitaxal Systems, Proceedings Röto'91, Eds. K. Bickmann, J. Hauck, Forschungszentrum Jülich GmbH, September 19 - 20, 1991, Jülich, Germany, S. 6.
4. P. Moeck, W. Hoppe, Direkte kristallographische Analysen mit Elektronenmikroskopen, Proceedings Röto'91, Eds. K. Bickmann, J. Hauck, Forschungszentrum Jülich GmbH, September 19 - 20, 1991, Jülich, Germany, S. 11.
5. P. Moeck, W. Hoppe, Direkte kristallographische Analysen mit Elektronenmikroskopen, Proceedings 24. Kolloquium des Arbeitskreises für Elektronenmikroskopische Direkt - Abbildung und Analyse von Oberflächen (EDO) der Deutschen Gesellschaft für Elektronenmikroskopie, September 1 - 7, 1991, Darmstadt, Germany, S. 99, poster.
6. P. Moeck, W. Hoppe, Direct Crystallographic Analyses Using Electron Microscopy, Proceedings of the 13th European Crystallographic Meeting, August 26 - 30, 1991, Triest, Italy, p. 53.
7. P. Moeck, R. Hedel, H. Berger, Vollständige kristallgittergeometrische Charakterisierung von epitaktischem CdTe auf GaAs, Proceedings Gemeinsame Tagung der Arbeitsgemeinschaft Kristallographie und der Vereinigung für Kristallographie, March 10 - 13, 1991, Munich, Germany, S. 199, poster.
8. P. Moeck, W. Hoppe, Direkte elektronenmikroskopische Methoden zur kristallographischen Analyse, Proceedings Gemeinsame Tagung der Arbeitsgemeinschaft Kristallographie und der Vereinigung für Kristallographie, March 10 - 13, 1991, Munich, Germany, S. 200, poster.
9. A. Wermke, T. Goebel, T. Boeck, P. Moeck, K. Jacobs, Beiträge zur Abscheidung von Hg1-xCdxTe - LPE - Schichten mit reproduzierbarer Mischkristallzusammensetzung und hoher Oberflächenperfektion, Proceedings Jahrestagung der Deutschen Gesellschaft für Kristallwachstum und Kristallzüchtung, March 6 - 8, 1991, Gießen, Germany, P41, poster.

1990

1. P. Moeck, W. Hoppe, Direkte kristallographische Analysen mit SEM, Proceedings 23. Kolloquium des Arbeitskreises für Elektronenmikroskopische Direkt - Abbildung und Analyse von Oberflächen (EDO) der Deutschen Gesellschaft für Elektronenmikroskopie, September 10 - 14, 1990, Berlin, Germany, S. 275, poster.
2. P. Moeck, Erstellung und Nutzung des stereographischen Projektion bei TEM - Untersuchungen, Proceedings 24. Jahrestagung der Vereinigung für Kristallographie, January 24 - 26, 1990, Neubrandenburg, Germany, S. 36, poster.
3. P. Moeck, Koordinatentransformation zur Entwicklung von TEM - Methoden, Proceedings 24. Jahrestagung der Vereinigung für Kristallographie, January 24 - 26, 1990, Neubrandenburg, Germany, S. 37, poster.

1987

1. D. Palm, J. Koehler, K. D. Schleinitz, P. Moeck, Präzisionsanalytik von (Hg1-zCdz)1-yTey für die Flüssigphasenepitaxie von Hg1-xCdxTe, Proceedings 5. Tagung Festkörperanalytik, June 30 - July 3, 1987, Karl-Marx-Stadt (Chemnitz), Germany, S. 83, poster.

1986

1. P. Moeck, Eine einfache Methode zur Orientierungsbestimmung im TEM, Proceedings IV. Symposium Physikalische Grundlagen zu Bauelementetechnologien der Mikroelektronik, September 10 - 12, 1986, Frankfurt-on-Oder, Germany, S. 8.
2. H. H. Richter, B. Tillack, R. Reinboth, P. Moeck, R. Banisch, G. Jatzkowski, M. Voelskow, J. Matthäi, E. Bott, Rekristallisation dicker Poly - Si - Schichten auf SiO2, Proceedings IV. Symposium Physikalische Grundlagen zu Bauelementetechnologien der Mikroelektronik, September 10 - 12, 1986, Frankfurt-on-Oder, S. 340.
3. B. Tillack, R. Banisch, H. H. Richter, R. Reinboth, P. Moeck, Recrystallization of Thick Polycrystalline Silicon on Insulating Layer (SOI) Using CO2 - Laser Irradiation, Proceedings of the IVth School on Quantum Electronics Laser and Applications, September, 1986, Bourgas, Bulgaria, p. 725.

1985

1. R. Reinboth, B. Tillack, G. Jatzkowski, H. H. Richter, R. Wuensch, P. Moeck, CW - CO2 Laser Recrystallization of Thick Polycrystalline Silicon Films on Insulating Layers, Proceedings of the 5th International Conference on Lasers and Their Applications (ILA 5), October 28 - November 1, 1985, Dresden, Germany, S. 195, poster.
2. R. Wuensch, H. H. Richter, R. Reinboth, P. Moeck, CW - CO2 Laser Power Optimization in Recrystallization of Poly Si Films on Insulating Layers by Optical Reflectivity Measurement, Proceedings of the 5th International Conference on Lasers and Their Applications (ILA 5), October 28 - November 1, 1985, Dresden, Germany, S. 66, poster.
3. R. Banisch, B. Tillack, B. Hunger, R. Reinboth, P. Moeck, High Resolution Four Points Probe Measurements on a SOI Structure Obtained by Laser Irradiation, Proceedings 9. Tagung Physik und Elektronik, October 22 - 25, 1985, Berlin, Germany, S. 123, poster.
4. B. Tillack, R. Reinboth, R. Banisch, P. Moeck, W. Malze, Recrystallization of Thick Polycrystalline Si - Films on SiO2 Using Laser Beam Irradiation, Proceedings 9. Tagung Physik und Elektronik, October 22 - 25, 1985, Berlin, Germany, S. 118.
5. P. Moeck, E. Bugiel, B. Tillack, R. Reinboth, TEM - Investigations of Laser Recrystallized Si on SiO2, Proceedings 19. Ceskoslovenska konference electronove mikroskopie, September 9 – 12, 1985, Olomouc, Czech Republic (CSSR), poster.
6. P. Moeck, B. Tillack, R. Reinboth, Origin of Defects During Si-Crystal Growth on a SiO2 Layer, Proceedings of the 7th International Summer School Defects in Crystals, Proc. Ed.: E. Mizera, May 23 - 30, 1985, Szczyrk, Poland, p. 730, poster.

1984

1. P. Moeck, E. Bugiel, Dendritic Growth Induced in Thin Silicon Films by CO2 - Laser Irradiation, Proceedings of the International Conference on Energy Pulse Modification of Semiconductors and Related Materials (EPM 84), September 25 - 28, 1984, Dresden, Germany, Proc. Ed.: K. Hennig, p. 411, poster.
2. B. Tillack, R. Reinboth, P. Moeck, E. Bugiel, R. Winkler, Recrystallization of Thin Polycrystalline Si Films Using CO2 - Laser Irradiation, Proceedings of the International Conference on Energy Pulse Modification of Semiconductors and Related Materials (EPM 84), September 25 - 28, 1984, Dresden, Germany, p. 406.
3. P. Moeck, E. Bugiel, TEM - Untersuchungen zum Wachstumsprozeß von Si - Schichten nach CO2-Laserbestrahlung, Proceedings III. Symposium Physikalische Grundlagen zu Bauelemente­technologien der Mikroelektronik, September 10 - 12, 1984, Frankfurt-on-Oder, Germany, S. 664, poster.
4. R. Reinboth, B. Tillack, P. Moeck, R. Winkler, Rekristallisation von Poly - Si auf isolierenden Schichten mittels CO2 – Laser, Proceedings III. Symposium Physikalische Grundlagen zu Bauelemente­technologien der Mikroelektronik, September 10 - 12, 1984, Frankfurt-on-Oder, Germany, S. 356.